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Silicon-based negative expansion in situ fast screening system

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The Silicon-based Negative Electrode Expansion In-situ Fast Screening System is designed for rapid and accurate evaluation of expansion behavior of silicon-based anode materials during charge and discharge processes. By adopting a coin-cell–referenced assembly concept, the system enables direct in-situ measurement of anode thickness expansion without the need for full cell fabrication. This significantly reduces sample preparation time, material consumption, and labor cost, providing an efficient screening tool for silicon-based anode R&D and material optimization.

Standards

(1) RSS1100 – Internal standard for spring-loaded in-situ expansion screening system.

(2) RSS1200 – Internal standard for servo-controlled pressure in-situ expansion screening system.

(3) RSS1300 – Internal standard for multi-structure anode expansion evaluation.

(4) RSS1400 – Internal standard for high-pressure precision in-situ expansion measurement.

Parameters

ModelRSS1100RSS1200RSS1300RSS1400
Number of Channels 4 4 4 4
Pressure Control Mode Spring loading Servo motor Servo motor Servo motor
Pressure Range Up to 5 kg 1–100 kg 1–100 kg 1–100 kg
Pressure Accuracy / Resolution ±0.1 kg 0.1 kg / ±0.3% FS 0.1 kg / ±0.3% FS 0.1 kg / ±0.3% FS
Thickness Measurement Range ±5 mm ±5 mm ±5 mm ±5 mm
Thickness Resolution / Accuracy 0.1 μm / ±1 μm 0.1 μm / ±1 μm 0.1 μm / ±1 μm 0.1 μm / ±1 μm
System Error ≤3% ≤3% ≤3% ≤3%
Applicable Samples Horizontal coin cells Coin-type, laminated cells, pouch cells
Max Sample Size — — — ≤ 60 × 90 × 4 mm (customizable)

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