DSHW2008D-S740 High Frequency Infrared Analyzer
- Instrumentintroduction
DSHX3000incorporatesDshing’syearsofexperienceinpreciousmetaltestingwithitsuniqueproductconfigurationsandfullyfunctionalsoftware.Itsergonomicallydesignandfriendlysoftwareinterfacesgranttheusersasimplemeasurementjob.
- Performancecharacteristics
- StableX-raytube2.Electric-coolingSi-Pindetectorinsteadofliquidnitrogencoolingdetector3.Dshingpatentproduct-Signal-to-NoiseEnhancer(SNE)improvesthestabilityandaccuracyofthemeasurementgreatly.4.In-builthighresolutioncamera,convenientforuserstoanalyzesamplesatanymoment5.Digitalpulseprocessorhandlesthedatarapidlyandaccurately6.Amplifiercircuit7.Highandlowvoltagepower8.Singlesamplechamber,openandclosemanually,safeandconvenient9.Non-vacuumChamber10.Triplesafetyprotectionmode11.Multi-variantnon-linearregressionprocedure12.Independentmatrixeffectcorrectionmodel13.Overallsteelstructure;elegantandfashionable14.Speciallydevelopedsoftwarewithfriendlyinterface15.Accuratemeasurementevenwhennostandardsample16.Timelydisplayofhighdefinitiongraphs,carefreemeasurement
- Technicalspecifications
- Measurableelements:Au,Ag,Pt,Pd,Cu,Zn,Ni,etc.2.Analysisaccuracy:0.05%（above96%）3.Analysisrange:1ppm-99.99%4.Formsofsamples:powder,solidandliquid5.Workingvoltage:AC110V/220V(ACpurifiedstabilizedvoltagepowersupplyissuggested)6.Abilityofsimultaneousanalysis:24elements7.EnergyResolution:(155±5）eV8.Measurementtime:60-200s9.Tubevoltage:5-50kV10.Tubecurrent:50-1000μA11.Ambienttemperature:15℃-30℃12.Ambienthumidity:35%-70%13.Weight:30KG
- Standardconfigurations
- Si-Pindetector2.Highvoltage5kv-50kv3.X-raytube50uA-1000uA4.SNE5.MCA6.Singlesamplechamber
- Applicationfields
- Au,Ag,Pt,Pd,Cu,Zn,Ni,etc.2.ElectronicandElectricAppliances(RoHS)3.Toy&Ceramics4.Metallurgy&Minerals
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