Flip Phone Durability Tester

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Get a quote：

Whats/App: +86 185 0176 3615

Web: qinsun-lab.com

The Flip Phone Durability Tester is a specialized testing machine designed to evaluate the fatigue life and mechanical reliability of clamshell and foldable mobile s. By simulating repeated opening and closing actions under controlled conditions, it provides precise and repeatable measurements of hinge durability, wear, and failure points. Compact and adaptable, this tester is suitable for integration into environmental chambers or limited lab spaces.

Application

(1) Fatigue life testing of clamshell and foldable smarts

(2) Mechanical reliability assessment of mobile hinges and flip mechanisms

(3) Quality control and production verification for mobile manufacturers

(4) Research and development of new hinge designs and materials

(5) Testing of models under accelerated use conditions

(6) Integration into environmental test chambers for combined temperature/humidity and mechanical testing

Standards

(1) GB/T 2423.2-2008 — Environmental testing for electrical and electronic products: Low-temperature test

(2) IEC 60068-2-1 — Environmental testing: Cold

(3) IEC 60068-2-2 — Environmental testing: Dry heat

(4) JEDEC JESD22-B111A — Mechanical shock and hinge testing for electronic devices

(5) ASTM F1977 — Standard test method for fatigue of electronic hinges

(6) ISO 9001 — Quality management requirements for testing processes

Features

(1) Compact and unique design suitable for limited laboratory spaces or environmental chambers

(2) Multi-station configuration (4 stations) for simultaneous testing of multiple devices

(3) High-precision stepper motor and Siemens PLC control for stable and repeatable operation

(4) Automatic swing arm angle adjustment from 0° to 180°

(5) Sensor-based direct detection of flip counts for accurate fatigue measurement

(6) Low-noise and maintenance-free operation

(7) User-friendly touch screen interface for easy parameter setup and monitoring

(8) Anti-static fixtures to protect devices during testing

Parameters

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