Silicon-based negative expansion in situ fast screening system

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The Silicon-based Negative Electrode Expansion In-situ Fast Screening System is designed for rapid and accurate evaluation of expansion behavior of silicon-based anode materials during charge and discharge processes. By adopting a coin-cell–referenced assembly concept, the system enables direct in-situ measurement of anode thickness expansion without the need for full cell fabrication. This significantly reduces sample preparation time, material consumption, and labor cost, providing an efficient screening tool for silicon-based anode R&D and material optimization.

Application

(1) In-situ expansion screening of silicon-based and silicon–carbon anode materials during electrochemical cycling.

(2) Comparative evaluation of expansion behavior under different compaction pressures.

(3) Fast performance screening of modified silicon–carbon materials in early-stage R&D.

(4) Expansion characterization of anode materials assembled in coin-cell–type, laminated, or pouch-type structures.

(5) Correlation analysis between anode swelling, structural stability, and electrochemical performance.

(6) Material selection and optimization for high-capacity lithium-ion battery anodes.

Standards

(1) RSS1100 – Internal standard for spring-loaded in-situ expansion screening system.

(2) RSS1200 – Internal standard for servo-controlled pressure in-situ expansion screening system.

(3) RSS1300 – Internal standard for multi-structure anode expansion evaluation.

(4) RSS1400 – Internal standard for high-pressure precision in-situ expansion measurement.

Parameters

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