Thermal Conductivity Tester for Silicone and Ceramic Substrates
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Web: qinsun-lab.com
Email：serving@qinsun-lab。com
Thermal Conductivity Tester for Silicone and Ceramic Substrates is a high-precision instrument designed to measure thermal resistance, thermal conductivity, and interface contact thermal resistance of thin heat conductors, solid electrical insulation materials, thermal grease, resins, rubber, beryllium oxide ceramics, and aluminum oxide ceramics. The instrument can test solid sheet materials directly, and with the use of a sample frame, it can measure powdered and paste materials.
Designed and manufactured in full compliance with ASTM D5470-2017 standards, tester incorporates over a decade of production experience and user feedback to provide mature and reliable performance. The instrument features servo-controlled precise automatic pressing, automatic thickness measurement, 6-point temperature gradient detection, and computer-controlled fully automatic operation. Built-in thermal protection around the test rod reduces environmental influence, enabling precise measurement of materials under varying pressures. This tester also includes automatic cold-end temperature compensation, eliminating the need for ice-water compensation.
Standards
The instrument complies with:
MIL-I-49456A – Insulating Sheet Materials, Thermally Conductive Resins, Glass-Fiber Reinforced Thermal Materials
GB 5598-2015 – Method for Determining Thermal Conductivity of Beryllium Oxide Ceramics
ASTM D5470-2017 – Test Method for Thermal Transmission Properties of Thin Thermally Conductive Solid Electrical Insulation Materials
GB/T 29313-2012 – Test Methods for Thermal Conductivity of Electrical Insulation Materials
Parameters
| Item | Specification |
|---|---|
| Sample size | Φ30 mm or 20×20 mm (standard); custom sizes available |
| Sample thickness | 0.001–50 mm; typical 0.02–20 mm |
| Hot plate temperature range | Room temperature–100 °C (standard); optional 300 °C or 500 °C |
| Cold plate temperature range | 0–99 °C; precision 0.01 °C (with high-precision low-temperature water bath) |
| Thermal conductivity range | 0.01–50 W/m·K; 0.1–300 W/m·K, software auto-switching |
| Thermal resistance range | 0.05–0.000005 m²·K/W |
| Pressure range | 0–1000 N; servo-controlled; precision 1 N |
| Thickness measurement range | 0–50 mm; resolution 0.1 μm; automatic |
| Sample quantity | 1 piece (thin film, multiple layers) |
| Measurement accuracy | Better than 3% |
| Test modes | Thermal resistance under varying pressures; material thermal conductivity; contact thermal resistance; aging reliability; compression performance; inter-sample contact thermal resistance |
| Automation | Computer-controlled fully automatic measurement and report output |
| Power supply | 220 V / 50 Hz; 500 W |
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