ASTM ISO White Light Interferometer Supplier

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Get a quote：

Whats/App: +86 156 1874 6768

Web: standard-groups.com

The White Light Interferometer is a non-contact optical surface measurement system designed for high-precision analysis of surface roughness, step height, thin film thickness, and three-dimensional topography. Featuring sub-nanometer vertical resolution, a fully automated precision stage, and white light interferometry combined with phase-shifting techniques, the system provides accurate and reliable surface characterization for a wide range of materials. Its cost-effective design and ease of operation make it suitable for both research and industrial quality control applications.

Standards

The White Light Interferometer supports surface measurement and analysis methods aligned with commonly adopted international standards, including but not limited to:

(1) ISO 25178 – Geometrical Product Specifications (GPS): Surface texture – Areal

(2) ISO 4287 – Surface texture: Profile method – Terms, definitions and parameters

(3) ISO 5436 – Measurement of surface roughness standards

(4) ISO 16610 – Filtration of surface texture data

Parameters

Features

Non-contact surface topography measurement with high vertical accuracy

Sub-nanometer vertical resolution for precise height and roughness analysis

White light interferometry combined with phase-shifting interferometry (PSI)

Four-band LED illumination to support multiple measurement modes

Fully automated optical microscope with easy operation

Automatic stage scanning and image stitching for large samples

Cost-effective design with high measurement accuracy

Accessories

(1) Fully automatic precision XY stage

(2) Four-band LED illumination module (Red, Green, Blue, White)

(3) Zoom imaging optics

(4) Integrated phase-shifting interferometry module

(5) Surface analysis and reporting software

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