Semiconductor Test Probe CPM-011
CPM provides a series of semiconductor test probe products. Our products offer high-performance compliance, extremely low and stable DC resistance. The products are developed specifically for semiconductor testing and can be applied with various sockets for examinations. The testing factories can ensure the comprehensive inspections of the connections among electrical parts on ICs before the shipment by changing the types of contact probes based on the features of testing objectives.
Materials and finishes:
- Plunger-Top: Pd Alloy
- Plunger-Bottom: Pd Alloy
- Barrel: P.B. / Au Plated
- Spring: Music Wire / Au Plated
Mechanical:
- Spring Force: 4grams
- Full Travel: 0.5mm
- Recommend Travel:0.35mm
- Mechanical Life: 50K
Electrical:
- Current Rating: 0.3A
- Contact Resistance:<200mΩ
在线联系供应商
Other supplier products
Conductive Cloth | Conductive fabric is made by electroless plating method to composite the metal and fiber, which is a high added value fiber possesses the softness ... | |
Semiconductor Test Probe CPM-011 | CPM provides a series of semiconductor test probe products. Our products offer high-performance compliance, extremely low and stable DC resistance.... | |
Loaded Board Test Probe CPM-4 | The loaded board test probe is applied for examining the loaded circuit boards. The common testing methods for loaded boards are ICT (In-Circuit Te... | |
Semiconductor Test Probe CPM-021 | CPM provides a series of semiconductor test probe products. Our products offer high-performance compliance, extremely low and stable DC resistance.... | |
Terminal Wire | Crimp terminals allow the wires to be easily connected to screw terminals, fast-on type terminals, wire splices and various types of combinations. ... |