High-Temperature Thermal Conductivity Tester
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Whats/App: +86 185 0176 3615
Web: qinsun-lab.com
This is a high-temperature thermal conductivity test instrument for thermal insulation materials developed on the basis of the water flow flat plate method thermal conductivity tester.it has improved resolution and automation, shortened test time, easier maintenance, and more reliable instrument performance. This instrument is suitable for testing the thermal conductivity of refractory insulation materials, ceramic fibers, insulation felts, textiles, boards, bricks and other materials at different temperatures. It is widely used in the analysis and testing of materials in universities, research institutes, quality inspection departments and production plants.
Standards:
ASTM C518-04 Test method for measuring steady-state heat flux and heat transfer characteristics by heat flow meter method;
ASTM C182-88 (2004) Standard Test Method for Thermal Conductivity of Thermal Insulation Refractory Bricks;
ASTM C202-93 (2004) Standard Test Method for Thermal Conductivity of Refractory Bricks;
ASTM C417-05 Standard Test Method for Thermal Conductivity of Unshaped Refractories;
ASTM C201-93 (2004) Standard test method for thermal conductivity of refractory materials;
Determination of steady-state thermal resistance and related characteristics of GB10295-88 thermal insulation materials (heat flow meter method);
YB/T 4130-2005 Refractory thermal conductivity test method (water flow plate method);
GB/T 17911 Refractory ceramic fiber products Thermal conductivity test method, etc.
Specifications:
| Model | STD-1 | STD-2 | STD-3 |
| Thermal conductivity range | 0.0010-3W/mk | 0.0010-3W/mk | 0.0010-3W/mk |
| Test accuracy | ±5% | ±5% | ±5% |
| Hot surface temperature range | 100-1200ºC | 100-1200ºC | 100-1200ºC |
| Calorimetric temperature control method | Constant temperature sink | Semiconductor refrigeration | Semiconductor refrigeration |
| Heat protection and temperature control method | Semiconductor refrigeration | Semiconductor refrigeration | Semiconductor refrigeration |
| Calorific plate size | 100×100(mm) | 100×100(mm) | 100×100(mm) |
| Heat flow meter size | 100×100(mm) | 100×100(mm) | 100×100(mm) |
| Sample temperature measurement points | 4 | 4 | 4 |
| Sample atmosphere environment | Air | Air | -0.095MPa;Atmosphere protection |
| Specimen size | 230×230~250×250mm;thickness 10~100mm | ||
| Measurement control method | Computer automatic test, data processing, and can generate test reports and print out. | ||
| Host power | Voltage 220V; frequency 50Hz; total power ≤5KW | ||
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