.

Advanced Multifunctional Thermal Conductivity Analyzer for Polymers

Get a quote:

Whats/App: +86 156 1874 6768

Web: standard-groups.com

Standards

The instrument is designed and operated in accordance with the following international and national standards:

ISO 22007-2:2008 / ISO 22007-2:2015:Plastics — Determination of thermal conductivity and thermal diffusivity — Part 2: Transient plane heat source (hot disc) method

GB/T 32064-2015:Determination of thermal conductivity and thermal diffusivity — Transient plane heat source (TPS) method

Parameters

ItemSpecification
Thermal conductivity range 0.001 – 500 W/(m·K)
Thermal conductivity resolution 0.0001 W/(m·K)
Thermal diffusivity range 0.1 – 100 m²/s
Thermal effusivity range 0.1 – 30 W/(m²·K)
Specific heat capacity range 0.1 – 5 kJ/(kg·°C)
Thermal resistance range 0.5 – 0.000005 mm²·K/W
Temperature measurement accuracy ≤ 0.001 °C
Relative measurement error ≤ 3%
Repeatability error ≤ 3%
Test time 1 – 120 s
Sample environment temperature Standard: room temperature
Optional temperature range –40 to 150 °C / –40 to 250 °C
Power supply AC 220 V ±10%, 50/60 Hz
Total system power < 500 W
Standard probe Φ15 mm, –40 to 150 °C

Features

Direct measurement of heat transfer behavior, significantly reducing testing time

Minimal influence from contact thermal resistance compared with steady-state methods

No special sample preparation required for solid materials with relatively flat surfaces

Wide measurement range suitable for both high and low thermal conductivity materials

Flexible testing schemes and mathematical models for different material types

Effective suppression of natural convection effects during measurement

Fast testing speed with stable and repeatable results

Fully automatic testing software for data analysis and report generation

Accessories

Hot Disk sensor (standard Φ15 mm probe)

Optional probes: Φ30 mm, Φ15 mm, Φ7.5 mm, Φ4.0 mm (–40 to 250 °C)

Solid sample clamping fixture

Powder, paste, and liquid sample testing cell

Dedicated thin-sample testing configuration

Optional temperature control chamber (–40 to 250 °C)

Optional vacuum testing configuration


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