SWIR Cameras and Accessories in Semiconductor Inspection
In the semiconductor inspection equipment, SWIR cameras can be used to inspect the quality of pure semiconductor material (usually silicon) after ingot growth. Furthermore, ingots that are subsequently sliced into wafers and these wafers can in a similar way be inspected for defects or cracks.
As the wafers are processed with successive layers to make transistors and memory cells used in modern integrated circuits, SWIR cameras are used to check alignment of the layers. High resolution scans of complete wafers are often accomplished with line scan cameras at the wafer defect inspection stage.
GHOPTO is a professional image sensor companies, we provide ingaas line scan camera, wafer inspection systems, 12k line scan camera, 3d line scan camera, high speed line scan camera, swir line scan camera, usb line scan camera, swir sensors, SWIR Cameras, SWIR Lenses & Accessories and etc. Want to know swir infrared? Please contact us.
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F35 F1.4 Fixed Focal Length Lens | Fixed focal length SWIR lens, image size 1", Φ16.4mm, F-Number 1.4, and the working wavelength is 700-1700nm, which matches the vast majority o... |
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320 InGaAs QVGA Area Sensor | GH-SW320 InGaAs image sensorusing InGaAs technologyis a kind of two-dimensional image sensor that has a hybrid structure consisting of a CMOS read... |
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640 SWIR InGaAs High Cost-Performance Camera USB3.0 | This camera using SWIR technologyindependently developed and designed by GHOPTOhas a resolution of 640×512, 15μm pixel pitch, and is equi... |
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GHOPTO InGaAs SWIR Short Wave Infrared Technology | At GHOPTO, our clients receive full access to unrestricted performance and full supply-chain control: from the unprocessed starting material (usual... |
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F50 F1.4 Fixed Focal Length Lenses | SWIR fixed focal length lensis used for fixed focal length camera, image size 1, Φ16.4mm, F-Number 1.4, and the working wavelength is 700-1700... |
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