SWIR Cameras and Accessories in Semiconductor Inspection
In the semiconductor inspection equipment, SWIR cameras can be used to inspect the quality of pure semiconductor material (usually silicon) after ingot growth. Furthermore, ingots that are subsequently sliced into wafers and these wafers can in a similar way be inspected for defects or cracks.
As the wafers are processed with successive layers to make transistors and memory cells used in modern integrated circuits, SWIR cameras are used to check alignment of the layers. High resolution scans of complete wafers are often accomplished with line scan cameras at the wafer defect inspection stage.
GHOPTO is a professional image sensor companies, we provide ingaas line scan camera, wafer inspection systems, 12k line scan camera, 3d line scan camera, high speed line scan camera, swir line scan camera, usb line scan camera, swir sensors, SWIR Cameras, SWIR Lenses & Accessories and etc. Want to know swir infrared? Please contact us.
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GH-SW640Pro-U3 SWIR Camera | GH-SW640Pro-U3 SWIR Camera The SWIR Cameraseries feature a 640 x 512 pixel InGaAs focal plane array (FPA) with a pitch of 15μm. The camera oper... |
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F16-160 F1.9-22 SWIR Zoom Lens | SWIR zoom lens, the working wavelength is 900-1700nm, compatible with most area array SWIR short wave infrared camerasupplied by GHOPTO as one of C... |
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GH-VSW640Pro-U2 & GH-VSW640Pro-Gnet SWIR Camera | GH-VSW640Pro-U2 & GH-VSW640Pro-Gnet SWIR Camera The short wave infrared cameraseries is based on an in-house developed InGaAs detector with a ... |
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640 SWIR InGaAs High Cost-Performance Camera USB2.0 | The 640 series is based on an InGaAs detector with a 640 x 512 pixel resolution. Our USB vision cameracamera is offered with a full-frame rate of... |
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640 SWIR InGaAs High Cost-Performance Camera GigE | GHOPTO SWIR imaginggigabit camerais based on an in-house developed InGaAs detector with multiple resolutions. The compact GH-SW640-GigE meets requi... |
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