SWIR Cameras and Accessories in Semiconductor Inspection
In the semiconductor inspection equipment, SWIR cameras can be used to inspect the quality of pure semiconductor material (usually silicon) after ingot growth. Furthermore, ingots that are subsequently sliced into wafers and these wafers can in a similar way be inspected for defects or cracks.
As the wafers are processed with successive layers to make transistors and memory cells used in modern integrated circuits, SWIR cameras are used to check alignment of the layers. High resolution scans of complete wafers are often accomplished with line scan cameras at the wafer defect inspection stage.
GHOPTO is a professional image sensor companies, we provide ingaas line scan camera, wafer inspection systems, 12k line scan camera, 3d line scan camera, high speed line scan camera, swir line scan camera, usb line scan camera, swir sensors, SWIR Cameras, SWIR Lenses & Accessories and etc. Want to know swir infrared? Please contact us.
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| GH-SW033-GigE & GH-SW130-GigE SWIR Camera | This series is a GigE interface short wave infrared camerawhich adopts SONY SenSWIR InGaAs sensor. This camera has high quantum efficiency and high... | |
| SHORT WAVE INFRARED INGAAS LINEAR IMAGE SENSORS | SHORT WAVE INFRARED ingaas linear image sensor GHOPTO is well known as the first commercial InGaAs imagingmanufacturer and athe leading image sens... | |
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| GH-SW1280-Gnet SWIR Camera | Temporarily unavailable The first domestic high-resolution SWIR camera independently developed and designed by GHOPTO has a resolution of 1280&tim... |
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