SWIR Cameras and Accessories in Semiconductor Inspection
In the semiconductor inspection equipment, SWIR cameras can be used to inspect the quality of pure semiconductor material (usually silicon) after ingot growth. Furthermore, ingots that are subsequently sliced into wafers and these wafers can in a similar way be inspected for defects or cracks.
As the wafers are processed with successive layers to make transistors and memory cells used in modern integrated circuits, SWIR cameras are used to check alignment of the layers. High resolution scans of complete wafers are often accomplished with line scan cameras at the wafer defect inspection stage.
GHOPTO is a professional image sensor companies, we provide ingaas line scan camera, wafer inspection systems, 12k line scan camera, 3d line scan camera, high speed line scan camera, swir line scan camera, usb line scan camera, swir sensors, SWIR Cameras, SWIR Lenses & Accessories and etc. Want to know swir infrared? Please contact us.
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GH-SW1280-Gnet SWIR Camera | Temporarily unavailable The first domestic high-resolution SWIR camera independently developed and designed by GHOPTO has a resolution of 1280&tim... |
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640 SWIR InGaAs High Cost-Performance Camera GigE | GHOPTO SWIR imaginggigabit camerais based on an in-house developed InGaAs detector with multiple resolutions. The compact GH-SW640-GigE meets requi... |
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F50 F1.4 Fixed Focal Length Lenses | SWIR fixed focal length lensis used for fixed focal length camera, image size 1, Φ16.4mm, F-Number 1.4, and the working wavelength is 700-1700... |
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GH-SW320-U2 & GH-SW320-Gnet SWIR Camera | The SWIR Camera series feature a 640 x 512 pixel InGaAs focal plane array (FPA) with a pitch of 15μm. The camera operates in the 900nm – 1... |
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