Nano Indenters
Whats/App: +86 156 1874 6768
Web: standard-groups.com
Standards
ISO 14577-1/2/3: Nanohardness and elastic modulus testing of metallic and non-metallic materials
ASTM E2546: Calibration of micro- and nanoindentation instruments
ISO 20502: Nanoscratch testing
ISO 1518: Coating scratch testing
ASTM D7027. D1624. D7187. C171: Scratch testing for coatings and plastics
Technical Specifications
| Module | Parameter | Specification |
|---|---|---|
| Nano Indenter | Max Load | 80 mN / 400 mN / 1800 mN / 4800 mN |
| Min Load | 0.1 mN | |
| Load Resolution | 3 nN | |
| Penetration Depth | 250 μm / 1 mm | |
| Displacement Resolution | 0.0003 nm | |
| Loading Rate | 0.04–12000 mN/min | |
| Nano Scratch | Max Scratch Force | 80 mN / 400 mN / 1800 mN / 4800 mN |
| Scratch Speed | 0.05–600 mm/min | |
| Max Friction Force | 400 mN / 1800 mN | |
| Micro Indenter | Max Load | 40 N / 200 N |
| Min Load | 2 mN / 10 mN | |
| Depth Resolution | 0.01 nm | |
| Penetration Depth | 1 mm | |
| Micro Scratch | Max Load | 40 N / 200 N |
| Max Scratch Length | 50 mm | |
| Max Friction Force | 20 N / 200 N | |
| Precision Positioning Stage | XY Range | 100 mm × 50 mm |
| Z Space | 150 mm | |
| Optical Metallographic Microscope | Magnification | 5X, 10X, 20X, 50X, 1000X (Total 400X–8000X) |
| Atomic Force Microscope (AFM) | Scan Range | 100 μm × 100 μm × 12 μm |
| XY Resolution | 0.1 nm | |
| Z Resolution | 0.02 nm | |
| General | Thermal Drift | <0.05 nm/s (compensated <1 nm) |
| Displacement Accuracy | Grating positioning ≤250 nm | |
| Max Indentation Depth | 1 mm | |
| Max Friction Force | 400 N | |
| Power Supply | AC 220V / 50Hz |
Features
Modular Integrated Design: Combines nano and micro indentation, scratch, and friction-wear tests in one instrument.
International Standard Compliance: Indentation tests conform to ISO 14577 and ASTM E2546; scratch tests conform to ISO 20502. ISO 1518. ASTM D7027. and others.
High-Precision Load System: Closed-loop piezoelectric drive ensures precise and stable load control, superior to traditional cantilever or open-loop systems.
Nanometer-Level Displacement Control: Depth is monitored in real-time by a capacitive sensor, with 0.0003 nm resolution and minimal thermal drift.
High-Accuracy Positioning Stage: Grating-based XY stage ensures repeatability of experiments.
Full-Field Scratch Imaging: Enables optical imaging throughout nanoscratch tests for easier analysis.
Fast Indentation and Scratch Mapping: 100 mapping points can be completed in 5–12 minutes.
Patented Technology: Diamond tip area function calibration ensures accurate and reliable indentation and scratch measurements.
Accessories
| No. | Accessory / Consumable | Quantity | Note |
|---|---|---|---|
| 1 | Diamond Indenter Tip | 1 | R-shaped tip, compatible with nano & micro modules |
| 2 | Diamond Scratch Tip | 1 | For nano/micro scratch tests |
| 3 | Constant Load Weights | Several | For micro/high-load calibration |
| 4 | Sample Fixture | 1 set | Fits various sample sizes |
| 5 | Optical Microscope Module | 1 set | For scratch imaging |
| 6 | AFM Probe | 1 set | High-resolution surface scanning |
| 7 | Power Cord | 1 set | AC 220V / 50Hz |
| 8 | Safety Cover | 1 | Provides operational protection |
| 9 | Software Installation Disk | 1 set | For data analysis |
| 10 | Tools & Manual | 1 set | Installation and operation guidance |
Testing Principles
Indentation Testing: Uses high-precision capacitive sensors to monitor the load-depth relationship of steel or diamond tips, providing hardness, elastic modulus, and creep data.
Scratch Testing: Applies controlled load to create scratches, recording friction force, scratch depth, and material damage features, allowing you to determine film-substrate adhesion, scratch hardness, and wear rate.
Multi-Scale Testing: The modular design allows comprehensive mechanical characterization at nano, micro, and high-load scales on the same sample.
Friction & Wear: Measures friction force changes during scratching to evaluate wear resistance and friction coefficient.
Operation Instructions
Confirm sample size and surface condition, then mount it on the precision positioning stage.
Select the test module (nano/micro indentation or scratch) and install the corresponding probe.
Set load, displacement, scratch speed, and number of cycles.
Enable thermal drift compensation to ensure stability during nanoscale tests.
Start the test and observe indentation or scratch morphology using optical microscopy or AFM.
After completion, turn off the instrument, remove the sample and probe, and record experimental data.
Avoid environmental vibrations and high humidity to maintain nanoscale measurement accuracy.
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