Benchtop Thermal Conductivity Tester
Whats/App: +86 156 1874 6768
Web: standard-groups.com
Standards
The instrument is designed and operated in accordance with the following international and national standards:
ISO 22007-2:2008 / ISO 22007-2:2015：Plastics — Determination of thermal conductivity and thermal diffusivity — Part 2: Transient plane heat source (hot disc) method
GB/T 32064-2015：Determination of thermal conductivity and thermal diffusivity — Transient plane heat source (TPS) method
Parameters
| Item | Specification |
|---|---|
| Thermal conductivity range | 0.001 – 500 W/(m·K) |
| Thermal conductivity resolution | 0.0001 W/(m·K) |
| Thermal diffusivity range | 0.1 – 100 m²/s |
| Thermal effusivity range | 0.1 – 30 W/(m²·K) |
| Specific heat capacity range | 0.1 – 5 kJ/(kg·°C) |
| Thermal resistance range | 0.5 – 0.000005 mm²·K/W |
| Temperature measurement accuracy | ≤ 0.001 °C |
| Relative measurement error | ≤ 3% |
| Repeatability error | ≤ 3% |
| Test time | 1 – 120 s |
| Sample environment temperature | Standard: room temperature |
| Optional temperature range | –40 to 150 °C / –40 to 250 °C |
| Power supply | AC 220 V ±10%, 50/60 Hz |
| Total system power | < 500 W |
| Standard probe | Φ15 mm, –40 to 150 °C |
Features
Direct measurement of heat transfer behavior, significantly reducing testing time
Minimal influence from contact thermal resistance compared with steady-state methods
No special sample preparation required for solid materials with relatively flat surfaces
Wide measurement range suitable for both high and low thermal conductivity materials
Flexible testing schemes and mathematical models for different material types
Effective suppression of natural convection effects during measurement
Fast testing speed with stable and repeatable results
Fully automatic testing software for data analysis and report generation
Accessories
Hot Disk sensor (standard Φ15 mm probe)
Optional probes: Φ30 mm, Φ15 mm, Φ7.5 mm, Φ4.0 mm (–40 to 250 °C)
Solid sample clamping fixture
Powder, paste, and liquid sample testing cell
Dedicated thin-sample testing configuration
Optional temperature control chamber (–40 to 250 °C)
Optional vacuum testing configuration
Test Procedures
Select an appropriate probe and testing mode according to material type and thermal range.
Place the Hot Disk sensor between two solid samples or insert it into the dedicated sample holder for powders, liquids, or pastes.
Ensure proper contact between the probe and sample surface without special surface treatment.
Set test parameters such as power, time, and temperature conditions in the software.
Start the test; the system automatically records transient temperature response.
The software calculates thermal conductivity and related parameters using the corresponding mathematical model.
Review results and export test reports upon completion.
Maintenance Information
Keep the Hot Disk probe clean and free from mechanical damage during handling and storage
Avoid excessive bending or pulling of probe leads
Periodically verify system performance using reference materials
Ensure stable power supply and appropriate environmental conditions during operation
Store probes and accessories in protective containers when not in use
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