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ISO 14577 Nano Indenter for Thin Film Mechanical Property Analysis

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The Nano Indenteris a comprehensive micro- and nano-mechanical testing system that integrates four functional modules: nanoindentation, nanoscratch, microindentation, and microscratch. Its modular design allows you to perform indentation, scratch, and friction-wear tests on the same device, ranging from nanoscale to high-load microscale. The instrument provides data on hardness, elastic modulus, creep behavior, elastic-plastic properties, fracture toughness, stress-strain curves, film-substrate adhesion, scratch hardness, friction coefficient, and wear rate, offering a full view of microscopic mechanical properties.

Standards

ISO 14577-1/2/3: Nanohardness and elastic modulus testing of metallic and non-metallic materials

ASTM E2546: Calibration of micro- and nanoindentation instruments

ISO 20502: Nanoscratch testing

ISO 1518: Coating scratch testing

ASTM D7027. D1624. D7187. C171: Scratch testing for coatings and plastics

Technical Specifications

ModuleParameterSpecification
Nano Indenter Max Load 80 mN / 400 mN / 1800 mN / 4800 mN
Min Load 0.1 mN
Load Resolution 3 nN
Penetration Depth 250 μm / 1 mm
Displacement Resolution 0.0003 nm
Loading Rate 0.04–12000 mN/min
Nano Scratch Max Scratch Force 80 mN / 400 mN / 1800 mN / 4800 mN
Scratch Speed 0.05–600 mm/min
Max Friction Force 400 mN / 1800 mN
Micro Indenter Max Load 40 N / 200 N
Min Load 2 mN / 10 mN
Depth Resolution 0.01 nm
Penetration Depth 1 mm
Micro Scratch Max Load 40 N / 200 N
Max Scratch Length 50 mm
Max Friction Force 20 N / 200 N
Precision Positioning Stage XY Range 100 mm × 50 mm
Z Space 150 mm
Optical Metallographic Microscope Magnification 5X, 10X, 20X, 50X, 1000X (Total 400X–8000X)
Atomic Force Microscope (AFM) Scan Range 100 μm × 100 μm × 12 μm
XY Resolution 0.1 nm
Z Resolution 0.02 nm
General Thermal Drift <0.05 nm/s (compensated <1 nm)
Displacement Accuracy Grating positioning ≤250 nm
Max Indentation Depth 1 mm
Max Friction Force 400 N
Power Supply AC 220V / 50Hz

Features

Modular Integrated Design: Combines nano and micro indentation, scratch, and friction-wear tests in one instrument.

International Standard Compliance: Indentation tests conform to ISO 14577 and ASTM E2546; scratch tests conform to ISO 20502. ISO 1518. ASTM D7027. and others.

High-Precision Load System: Closed-loop piezoelectric drive ensures precise and stable load control, superior to traditional cantilever or open-loop systems.

Nanometer-Level Displacement Control: Depth is monitored in real-time by a capacitive sensor, with 0.0003 nm resolution and minimal thermal drift.

High-Accuracy Positioning Stage: Grating-based XY stage ensures repeatability of experiments.

Full-Field Scratch Imaging: Enables optical imaging throughout nanoscratch tests for easier analysis.

Fast Indentation and Scratch Mapping: 100 mapping points can be completed in 5–12 minutes.

Patented Technology: Diamond tip area function calibration ensures accurate and reliable indentation and scratch measurements.

Accessories

No.Accessory / ConsumableQuantityNote
1 Diamond Indenter Tip 1 R-shaped tip, compatible with nano & micro modules
2 Diamond Scratch Tip 1 For nano/micro scratch tests
3 Constant Load Weights Several For micro/high-load calibration
4 Sample Fixture 1 set Fits various sample sizes
5 Optical Microscope Module 1 set For scratch imaging
6 AFM Probe 1 set High-resolution surface scanning
7 Power Cord 1 set AC 220V / 50Hz
8 Safety Cover 1 Provides operational protection
9 Software Installation Disk 1 set For data analysis
10 Tools & Manual 1 set Installation and operation guidance

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