SWIR LENSES, INFRARED LENS, IR CAMERA LENS & ACCESSORIES
GHOPTO provides various of swir imaging lenses & accessories for short wave IR camera that can satisfy your requirements in different aspects, including Fixed focal length SWIR infrared camera lens and Zoom SWIR infrared camera lens.
GHOPTO Fixed focal length SWIR lens and SWIR zoom lens are specifically designed for SWIR (short wave infrared) cameras and their applications. These SWIR lensesare ideal for a variety of imaging applications where ingaas linear image sensor and SWIR cameras are employed such as machine vision cameras, photovoltaics, security & surveillance, and semiconductor inspection.
SWIR LENSES & ACCESSORIES TYPES
1550nm Laser Illumination Module SWIR Lenses & Accessories
Intelligent auto-dimmingSmart Sync ZoomSmart match, Hot-swappableReal-time monitoring, intelligent controlIntelligent Temperature ControlPhotoelectric conversion rate of 90%
SWIR Lenses
Fixed focal length SWIR lens, which matches the vast majority of area array short-wave near-infrared (NIR) cameras and other infrared short wave
If you want to know more kinds of swir sensors, please visit our website.
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Other supplier products
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F35 F1.4 Fixed Focal Length Lens | Fixed focal length SWIR lens, image size 1", Φ16.4mm, F-Number 1.4, and the working wavelength is 700-1700nm, which matches the vast majority o... |
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GH-SW320 InGaAs VGA Area Sensor | GH-SW320 SWIR Sensor are two-dimensional image sensors that have a hybrid structure consisting of a CMOS readout circuit (ROIC: readout integrated ... |
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GH-SW033-U3 & GH-SW130-U3 Vis-SWIR Camera | This series is a TE-Cooling USB3.0 interface short-wave vis swir camera which adopts SONY SenSWIR InGaAs sensor. This camera has high quantum effic... |
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SWIR CAMERAS | Specialist in SWIR imager Indium Gallium Arsenide (InGaAs) imaging technology, GHOPTO IR camera manufacturer supplies a wide range of high-quality ... |
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SWIR Cameras and Accessories in Semiconductor Inspection | In the semiconductor inspection equipment, SWIR cameras can be used to inspect the quality of pure semiconductor material (usually silicon) after i... |
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