DSHW2008D-S740 High Frequency Infrared Analyzer
- Applicationfields
- ContentdeterminationofpreciousmetalsAu,Pt,Ag,etcandjewelries
- Thicknessmeasurementofmetalplatingandcontentdeterminationofplatingsolutionsandplating
- Preciousmetalsandjewelriesprocessingindustries,banks,jewelriesshopsandtestingcenters,platingindustries
- Instrumentintroduction
- DSHX600incorporatesDshing’syearsofexperienceinpreciousmetalstestingwithuniqueproductconfigurationsandfullyfunctionalsoftware.Itsergonomicallydesignandfriendlysoftwareinterfacesgranttheusersasimplemeasurementjob.
- X600isconfiguredwithanefficientandpracticalproportionalcounter,deliveringcompositionsandplatingthicknessmeasurementsofpreciousmetalsinareasonablecost.ThenovelDSHX600hasmodernoutlook,structureandcolordesign.
- Performancecharacteristics
- Specializedpreciousmetalsandplatingthicknesstesting
- IntelligentPreciousMetalsAnalysisSoftwarematchesperfectlywiththehardware.
- Arbitraryoptionalanalysisandidentificationmodels
- Independentmatrixeffectcorrectionmodels
- Multi-variablenon-linearregressionprocedure
- Technicalspecifications
- Measurableelements:Au,Ag,Cu,etc
- MeasurementPrecision(StandardDeviationStatistic):
- Tubevoltage:5-50KV
- Tubecurrent:50-1000μA
- Testtime:60~100s
- Ambienthumidity:<=70%
- Ambienttemperature:5℃-30℃
- Power:AC220V+-5V(ACpurifiedstabilizedvoltagepowersupplyisrecommended)
- Standardconfigurations
- Singlesamplechamber
- Laserpositioningdevice
- Proportionalcounter
- Signaldetectionelectroniccircuit
- Highandlowvoltagepowersupplies
- X-raytube
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