DSHW2008D-S740 High Frequency Infrared Analyzer

1. 1. Instrumentintroduction

   DSHX3000incorporatesDshing’syearsofexperienceinpreciousmetaltestingwithitsuniqueproductconfigurationsandfullyfunctionalsoftware.Itsergonomicallydesignandfriendlysoftwareinterfacesgranttheusersasimplemeasurementjob.

   1. Performancecharacteristics
   2. StableX-raytube2.Electric-coolingSi-Pindetectorinsteadofliquidnitrogencoolingdetector3.Dshingpatentproduct-Signal-to-NoiseEnhancer(SNE)improvesthestabilityandaccuracyofthemeasurementgreatly.4.In-builthighresolutioncamera,convenientforuserstoanalyzesamplesatanymoment5.Digitalpulseprocessorhandlesthedatarapidlyandaccurately6.Amplifiercircuit7.Highandlowvoltagepower8.Singlesamplechamber,openandclosemanually,safeandconvenient9.Non-vacuumChamber10.Triplesafetyprotectionmode11.Multi-variantnon-linearregressionprocedure12.Independentmatrixeffectcorrectionmodel13.Overallsteelstructure;elegantandfashionable14.Speciallydevelopedsoftwarewithfriendlyinterface15.Accuratemeasurementevenwhennostandardsample16.Timelydisplayofhighdefinitiongraphs,carefreemeasurement
   3. Technicalspecifications
   4. Measurableelements:Au,Ag,Pt,Pd,Cu,Zn,Ni,etc.2.Analysisaccuracy:0.05%（above96%）3.Analysisrange:1ppm-99.99%4.Formsofsamples:powder,solidandliquid5.Workingvoltage:AC110V/220V(ACpurifiedstabilizedvoltagepowersupplyissuggested)6.Abilityofsimultaneousanalysis:24elements7.EnergyResolution:(155±5）eV8.Measurementtime:60-200s9.Tubevoltage:5-50kV10.Tubecurrent:50-1000μA11.Ambienttemperature:15℃-30℃12.Ambienthumidity:35%-70%13.Weight:30KG
   1. Standardconfigurations
   2. Si-Pindetector2.Highvoltage5kv-50kv3.X-raytube50uA-1000uA4.SNE5.MCA6.Singlesamplechamber
   1. Applicationfields
   2. Au,Ag,Pt,Pd,Cu,Zn,Ni,etc.2.ElectronicandElectricAppliances(RoHS)3.Toy&Ceramics4.Metallurgy&Minerals

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