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ISO 25178 Advanced 3D Optical Surface Profilometer China Manufacturer

Get a quote:

Whats/App: +86 156 1874 6768

Web: standard-groups.com

The Advanced 3D Optical Surface Profilometer is a high-end three-dimensional surface measurement system designed for accurate and efficient characterization of surface topography. With high-speed scanning, ultra-high vertical resolution, and multiple integrated optical modes, it provides versatile solutions for surface analysis across a wide range of materials and applications. The system combines advanced optical technologies on a single platform to achieve reliable, repeatable, and high-resolution 3D surface measurements.

Standards

The system is suitable for surface topography measurement and analysis in accordance with widely used international standards, including but not limited to:

(1) ISO 25178 – Geometrical Product Specifications (GPS): Surface texture – Areal

(2) ISO 4287 – Surface texture: Profile method – Terms, definitions and parameters

(3) ISO 16610 – Filtration of surface texture data

(4) ISO 5436 – Measurement of surface roughness standards

Parameters

ParameterSpecification
Camera speed Up to 200 FPS
Vertical (Z) resolution Sub-nanometer, independent of objective magnification or scan range
Imaging modes Confocal, White Light Interferometry, Bright Field, Dark Field, Zoom
XY stage Fully automatic motorized XY stage
Sample alignment Adjustable tilt stage
Scanning capability Large-area scanning with automatic stitching

Features

Multi-mode optical measurement integrated on a single platform

High-speed imaging enabled by dedicated high-speed cameras

Sub-nanometer vertical resolution for precise height measurement

Open system architecture for flexible sample handling

Automatic XY stage and tilt adjustment for accurate positioning

Support for large-area scanning and automatic image stitching

High image quality achieved through optimized optical paths

Accessories

(1) Motorized automatic XY stage

(2) Adjustable tilt sample stage

(3) Multi-wavelength LED illumination module

(4) Film thickness measurement module (spectral reflectance based)

(5) Atomic Force Microscope (AFM) module

(6) Dedicated analysis and reporting software


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