ISO 25178 Advanced 3D Optical Surface Profilometer China Manufacturer
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Whats/App: +86 156 1874 6768
Web: standard-groups.com
The Advanced 3D Optical Surface Profilometer is a high-end three-dimensional surface measurement system designed for accurate and efficient characterization of surface topography. With high-speed scanning, ultra-high vertical resolution, and multiple integrated optical modes, it provides versatile solutions for surface analysis across a wide range of materials and applications. The system combines advanced optical technologies on a single platform to achieve reliable, repeatable, and high-resolution 3D surface measurements.
Standards
The system is suitable for surface topography measurement and analysis in accordance with widely used international standards, including but not limited to:
(1) ISO 25178 – Geometrical Product Specifications (GPS): Surface texture – Areal
(2) ISO 4287 – Surface texture: Profile method – Terms, definitions and parameters
(3) ISO 16610 – Filtration of surface texture data
(4) ISO 5436 – Measurement of surface roughness standards
Parameters
| Parameter | Specification |
|---|---|
| Camera speed | Up to 200 FPS |
| Vertical (Z) resolution | Sub-nanometer, independent of objective magnification or scan range |
| Imaging modes | Confocal, White Light Interferometry, Bright Field, Dark Field, Zoom |
| XY stage | Fully automatic motorized XY stage |
| Sample alignment | Adjustable tilt stage |
| Scanning capability | Large-area scanning with automatic stitching |
Features
Multi-mode optical measurement integrated on a single platform
High-speed imaging enabled by dedicated high-speed cameras
Sub-nanometer vertical resolution for precise height measurement
Open system architecture for flexible sample handling
Automatic XY stage and tilt adjustment for accurate positioning
Support for large-area scanning and automatic image stitching
High image quality achieved through optimized optical paths
Accessories
(1) Motorized automatic XY stage
(2) Adjustable tilt sample stage
(3) Multi-wavelength LED illumination module
(4) Film thickness measurement module (spectral reflectance based)
(5) Atomic Force Microscope (AFM) module
(6) Dedicated analysis and reporting software
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