MATRIX-50 Fourier Transform Infrared FTIR Spectrometers

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Fourier Transform Infrared FTIR Spectrometers - Powerful and Intelligent Operation Software Design

1. 2. Rich spectrum library, powerful self-built library function and high-quality spectrum search;3. Real-time display of data acquisition, capable of continuously showing the data acquisition process and the spectrum preview mode;4. The software includes functions such as baseline correction, data conversion, multi-component quantification, curve peak fitting, automatic H20/CO2 compensation, absorbance transmittance conversion, KK conversion, peak identification, basic arithmetic operations, Y-axis normalization, QC comparison, and basic analysis; it supports over a dozen formats such as CSV, SPA, DPT, TXT, etc.; it allows for the arbitrary switching between wavenumber (cm-1) and wavelength (um).

Compact and Laboratory-Friendly

Small footprint allows easy placement in laboratories with limited space.

User-friendly interface reduces operational complexity for routine and advanced measurements.

Compatible with a wide range of laboratory accessories and consumables. For full lab setup, see Hench’s selection oflab supplies.

Reliability and Versatility

High-stability optics provide consistent spectral data.

Suitable for diverse research applications, from material identification to quantitative analysis.

The MATRIX-50 spectrometer integrates well with other laboratory instruments, includinghydraulic presses machines, for sample preparation and material testing.

Principle of Instrument

MATRIX-50 FTIR uses the working principle of interferometer frequency modulation. The light emitted by the source passes through the Michelson interferometer to form interference light, which then irradiates the sample. The receiver collects the interference light carrying the sample information, and the computer software applies Fourier transform to obtain the sample spectrum.

Experimental Principle

ATR is designed based on the principle of internal light reflection. Infrared light emitted from the source passes through a crystal with a high refractive index and reaches the interface with a crystal of lower refractive index. When the angle of incidence is greater than the critical angle, the incident light is reflected. However, not all infrared light is reflected back; instead, part of it penetrates to a certain depth into the sample surface before returning. During this process, the sample selectively absorbs specific frequencies of the incident light. As a result, the intensity of the reflected light is reduced, producing a spectrum similar to that of transmitted absorption. This allows the structural information of the chemical composition in the surface layer of the sample to be obtained.

Hench – Trusted Infrared Spectrometer Manufacturers

Hench is recognized among leadinginfrared spectrometer manufacturers, supplying high-quality lab instruments with a focus on accuracy, durability, and service. Their products are widely used in universities, research institutes, and industrial laboratories worldwide, supporting both routine testing and advanced research.

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