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640 SWIR InGaAs High Cost-Performance Camera GigE

GHOPTO SWIR imaginggigabit camerais based on an in-house developed InGaAs detector with multiple resolutions. The compact GH-SW640-GigE meets requirements of high sensitivity in the SWIR range from 900nm to1700nm and with accompanied by extended wavelength from 400nm to 1700nm options. The short wave infrared cameracomes with PAL output and GigE vision interface, supporting 14-bit data transfer and adjustable exposure time. The SWIR Short Wave InfraredGigE/GIG-E vision 2.0camera offers unique capabilities for various applications in Industrial inspections as nondestructive test, Si wafer inspection, semiconductor circuit detection, laser beam profiling and process monitoring. We also offer 10 GIG-E visioncamera as well as USB infrared camera.

PERFORMANCE ADVANTAGES OF GH-SW640-GIGE

TECHNICAL INFORMATION OF GH-SW640-GIGE

Type

GH-SW640-GigE

Array Type

InGaAs

FPA Format

640 x 512

Spectral Response

Pixel Pitch

15μm

Active Area

Quantum Efficiency

>70%(1.0 ~ 1.6μm)

Frame Rate

100 Hz

Integration Type

snapshot

Integration Time Range

50 μs ~ 20 ms /100Hz maximum integral:9ms

On-board Image Processing

One/two-point correction、bad pixel replacement、image denoising 、image smoothing, controllable shutter compensation

Operability

>99.5%

Dynamic Range

76 dB( linear mode )

Charge handing capacity

ADC

14bit

Analog Output

PAL、SMA

Digital Output

GigE

Image Acquisition

GUI / SDK

Trigger

Trigger RS485(optional)

Power Input

DC 12V

Power Consumption

<4W(noTEC)

Lens Mount

C-Mount

Operating Temperature

-20 ℃ ~ +50 ℃ / -40 ℃ ~ +60 ℃(optional)

Storage Temperature

-40 ℃ ~ +80 ℃

DRAWING OF GH-SW640-GIGE



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