GH-SW1280-Gnet SWIR Camera
Temporarily unavailable
The first domestic high-resolution SWIR camera independently developed and designed by GHOPTO has a resolution of 1280×1024 pixels, 15μm pixel pitch, and high-sensitivity detection capability in the 900nm-1700nm band, which can provide high-definition images in this band. The camera has TE Cooler built in, has lower dark current, and the readout noise is as low as 40e-. In addition, the camera has a variety of gain modes and non-uniformity correction, which can improve high-definition images in low light condition at night, and can also image through fog and haze. Small in size and light in weight, it is easy to integrate in surveillance systems such as UAV, ships, and airborne optoelectronic pods. It is widely used in various fields such as wafer inspection, surveillance, and hyperspectral imaging.
1.3M Resolution
15μm Pixel Pitch
Low Readout Noise
TE Cooler
14 bit GigE Output
GHOPTO is a professional swir camera manufacturer, we provide gige camera, gige camera interface, laser light module, short wave infrared, etc. For more information, please feel free to contact us!
Other supplier products
|
|
SWIR LENSES, INFRARED LENS, IR CAMERA LENS & ACCESSORIES |
GHOPTO provides various of swir imaging lenses & accessories for short wave IR camera that can satisfy your requirements in different aspects, ... |
|
|
SWIR CAMERAS |
Specialist in SWIR imager Indium Gallium Arsenide (InGaAs) imaging technology, GHOPTO IR camera manufacturer supplies a wide range of high-quality ... |
|
|
GHOPTO China Infrared Array Sensor |
At GHOPTO China Infrared Array Sensor, our clients receive full access to unrestricted performance and full supply-chain control: from the unproces... |
|
|
F16-160 F1.9-22 SWIR Zoom Lens |
SWIR zoom lens, the working wavelength is 900-1700nm, compatible with most area array SWIR short wave infrared camerasupplied by GHOPTO as one of C... |
|
|
SWIR Cameras and Accessories in Semiconductor Inspection |
In the semiconductor inspection equipment, SWIR cameras can be used to inspect the quality of pure semiconductor material (usually silicon) after i... |
供应产品
Same products
