Integrated Material Surface Performance Testing Platform
Get a quote：
Whats/App: +86 181 0160 0864
Web: gellowen.co.uk
Integrated Material Surface Performance Testing Platform is a versatile system designed for comprehensive characterization of material surface and mechanical properties on a single platform. It enables evaluation of hardness, elastic modulus, scratch adhesion, coating thickness, surface roughness, and related parameters. By integrating indentation, scratch, film thickness measurement, three-dimensional surface morphology, and optional environmental modules, the platform provides high-precision measurements from the nanometer to micrometer scale with excellent repeatability and flexibility.
Application
Mechanical Property Characterization
Measurement of hardness, elastic modulus, creep behavior, and load–displacement response of bulk materials and coatings.
Scratch and Adhesion Evaluation
Assessment of coating adhesion, scratch resistance, scratch hardness, and surface damage evolution.
Thin Film Thickness Measurement
Non-destructive determination of coating thickness based on spectral reflectance.
Surface Morphology and Roughness Analysis
High-resolution three-dimensional imaging of scratch tracks, indentations, and surface features.
Multi-Property Integrated Testing
Combined indentation, scratch, morphology, and thickness measurements performed on a single platform.
Standards
(ISO 14577-5) Metallic materials — Instrumented indentation test for hardness and materials parameters — Part 5: Linear elastic dynamic instrumented indentation test
(ISO 1518-1) Paints and varnishes — Determination of scratch resistance — Part 1: Constant loading method
Parameters
| Parameter | Specification |
|---|---|
| Load Range | mN to 200 N (interchangeable modules) |
| Measurement Scale | Nanometer to micrometer |
| Indenter Types | Berkovich, Vickers, spherical, cube corner, Knoop |
| XY Platform | Fully automatic, high-precision positioning |
| Z-Axis Drive | High-resolution encoder, precision Z-axis motion |
| Film Thickness Measurement | Non-contact, spectral reflectance based |
| Surface Imaging Modes | Bright field, dark field, white light interferometry, rotating disk confocal |
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